With its ioNext platform on glass substrate, Teem Photonics offers a new line of compact, stable, reliable, and high performance interferometers for the measurement of picometric displacements and vibrations.
The PicoMove interferometers of TEEM are based on the monolithic integration of a specific Michelson-like architecture on a single chip which provides measurements with a high degree of stability and intrinsic ultra-low noise.
The eye-safe 1.55µm operating wavelength provides compatibility with commercial Telecom sources.
The sensor design also handles visible wavelengths to ease the optical beam alignment.
Teem proposes packaging options with low thermal expansion material and for UHV environment. Electrical parts of the measurement system (laser source, detectors) are remote through reliable fiber pigtailing.
PicoMove Interferometers Principle
Optical output responses to the mirror displacement
In the PicoMove design, the laser beam is split into two arms: a reference arm with a constant length and a measurement arm that is reflected on the moving object. The length of this latter arm varies with the position of the moving object. An interferences area is then created between the two beams. The optical power is extracted at two predetermined positions of the interferences area, such that, a precise π/2 phase shift is assured between the two measurements. The sinusoidal curves show the typical variations on the measurement ports (Meas1 and Meas2) due to a displacement of the reflective object. This π/2 phase shift allows determining both amplitude and direction of the mirror displacement.